Component
École Nationale Supérieure d'Électrotechnique d'Électronique
Objectives
Introduce and illustrate issues relating to reliability, protection, and fault tolerance in conversion structures. Presentation of reliability models and advanced technological solutions.
Description
Nature of constraints (environmental, switching functionality, usage constraints), - Design rules, SOA reminders, extreme conditions for semiconductor components, robustness, protection solutions, - Critical failure conditions, I²T and destruction energy - explosion, protection solutions, Component aging and technological aspects, main models, diagnostic design using predictive models or sensors, Methodological approach: failure rate, reliability model, reliability diagram, orders of magnitude and numerical applications, Application to conversion structures with and without redundancy, Illustration of secure structures with shared parallel passive redundancy and integrated serial active redundancy